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IREM (Infrared Emission Microscope) System Sales and IREM Stage Service

IREM (Infrared Emission Microscope) System Sales and IREM Stage Service

IREM (Infrared Emission Microscope) System Sales and IREM Stage Service:
The IREM provides backside failure analysis, yield enhancement and debug with unprecedented visibility to the faintest levels of near-IR emission. The IREM is the industry standard for emission microscopy.

We invite you to contact our sales department for more information, to receive a quote, to arrange a demonstration or to send samples in for test.

Downloads

IREM-IV Brochure.pdf (PDF 4,500KB)

Applications

  • Backside failure analysis
  • Yield enhancement
  • Debug
  • Wafer Probing

Technical Information

  • Industry’s highest sensitivity detectors
  • Superior ultra low noise read electronics
  • Precision fault localization
  • Custom optimized optics
  • High performance Motion X Corporation 3-axis position system
  • Advanced Infrared Imaging Software (AIRIS)
  • CAD Navigation
  • Inverted configuration for backside analysis
  • Unmatched signal-to-noise ratio
  • Light tight enclosure
  • Custom docking solutions